Zwei-Punkt Kalibrierung einer On-Chip Spannungsreferenz im Fertigungstest

Dominik Gruber, Timm Ostermann

Research output: Chapter in Book/Report/Conference proceedingConference proceedingspeer-review

Original languageGerman (Austria)
Title of host publication24. GI/GMM/ITG-Workshop: Testmethoden und Zuverlässigkeit von Schaltungen und Systemen
Number of pages6
Publication statusPublished - 2012

Fields of science

  • 102005 Computer aided design (CAD)
  • 202006 Computer hardware
  • 202018 Semiconductor electronics
  • 202028 Microelectronics
  • 202037 Signal processing

JKU Focus areas

  • Computation in Informatics and Mathematics
  • Mechatronics and Information Processing
  • Nano-, Bio- and Polymer-Systems: From Structure to Function

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