Abstract
The yield stress of monocrystalline Rhenium nanowires grown by directional solidification was measured by nanobending testing. The average yield stress calculated from the deflection was between 10 and 60 GPa, which represents roughly 10% of the rhenium Young modulus along the nanowire’s direction. Analytical results are compared to the ones obtained with a more complex finite element simulation. Origins of the experimental observed yield stress values variations are discussed in terms of experimental measurement errors, elastic anisotropy, and the presence of an oxide layer on the nanowire surface.
| Original language | English |
|---|---|
| Article number | 111919 |
| Pages (from-to) | 111919 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 91 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 2007 |
Fields of science
- 104005 Electrochemistry
- 104006 Solid state chemistry
- 104014 Surface chemistry
- 104017 Physical chemistry
- 105113 Crystallography
- 105116 Mineralogy
- 503013 Subject didactics of natural sciences
- 204 Chemical Process Engineering
- 204001 Inorganic chemical technology
- 205016 Materials testing
- 210006 Nanotechnology
- 211104 Metallurgy
JKU Focus areas
- Engineering and Natural Sciences (in general)