X-ray investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping

Günther Bauer, P. Hamberger, E. Kasper, H. Kibbel, Ewald Koppensteiner, A. Pesek, H. Presting

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Original language	English
Title of host publication	Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II
DOIs	https://doi.org/10.1117/12.162744
Publication status	Published - 1993

Fields of science

This output contributes to the following UN Sustainable Development Goals (SDGs)

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title = "X-ray investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping",

author = "G{\"u}nther Bauer and P. Hamberger and E. Kasper and H. Kibbel and Ewald Koppensteiner and A. Pesek and H. Presting",

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X-ray investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping. / Bauer, Günther; Hamberger, P.; Kasper, E. et al.
Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II. 1993.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - X-ray investigation of strain relaxation in short-period SimGen superlattices using reciprocal space mapping

AU - Bauer, Günther

AU - Hamberger, P.

AU - Kasper, E.

AU - Kibbel, H.

AU - Koppensteiner, Ewald

AU - Pesek, A.

AU - Presting, H.

PY - 1993

Y1 - 1993

U2 - 10.1117/12.162744

DO - 10.1117/12.162744

M3 - Conference proceedings

SN - 1-55899-352-5

BT - Proceedings Volume 1985, Physical Concepts and Materials for Novel Optoelectronic Device Applications II

ER -