X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

Eduardo Abramof; Vaclav Holy; Ewald Koppensteiner; J. Kubena; K. Lischka; A. Pesek

doi:10.1063/1.354828

X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

Eduardo Abramof
, Vaclav Holy
, Ewald Koppensteiner
, J. Kubena
, K. Lischka
, A. Pesek

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1736-1743
Number of pages	8
Journal	Journal of Applied Physics
Volume	74
Issue number	3
DOIs	https://doi.org/10.1063/1.354828
Publication status	Published - 1993

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
103040 Photonics
202032 Photovoltaics
210006 Nanotechnology

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title = "X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers",

author = "Eduardo Abramof and Vaclav Holy and Ewald Koppensteiner and J. Kubena and K. Lischka and A. Pesek",

year = "1993",

doi = "10.1063/1.354828",

language = "English",

volume = "74",

pages = "1736--1743",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

AU - Abramof, Eduardo

AU - Holy, Vaclav

AU - Koppensteiner, Ewald

AU - Kubena, J.

AU - Lischka, K.

AU - Pesek, A.

PY - 1993

Y1 - 1993

UR - https://www.scopus.com/pages/publications/0027640042

U2 - 10.1063/1.354828

DO - 10.1063/1.354828

M3 - Article

SN - 0021-8979

VL - 74

SP - 1736

EP - 1743

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 3

ER -

X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

Fields of science

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