X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

Eduardo Abramof, Vaclav Holy, Ewald Koppensteiner, J. Kubena, K. Lischka, A. Pesek

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalJournal of Applied Physics
Publication statusPublished - 1993

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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