X-ray diffractometry of small defects in layered systems

Eduardo Abramof; Vaclav Holy; Ewald Koppensteiner; J. Kubena; A. Pesek

doi:10.1088/0022-3727/26/4A/031

X-ray diffractometry of small defects in layered systems

Eduardo Abramof
, Vaclav Holy
, Ewald Koppensteiner
, J. Kubena
, A. Pesek

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	A146-A150
Journal	Journal of Physics D: Applied Physics
Volume	26
Issue number	4
DOIs	https://doi.org/10.1088/0022-3727/26/4A/031
Publication status	Published - 14 Apr 1993

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
103040 Photonics
202032 Photovoltaics
210006 Nanotechnology

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10.1088/0022-3727/26/4A/031

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title = "X-ray diffractometry of small defects in layered systems",

author = "Eduardo Abramof and Vaclav Holy and Ewald Koppensteiner and J. Kubena and A. Pesek",

year = "1993",

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T1 - X-ray diffractometry of small defects in layered systems

AU - Abramof, Eduardo

AU - Holy, Vaclav

AU - Koppensteiner, Ewald

AU - Kubena, J.

AU - Pesek, A.

PY - 1993/4/14

Y1 - 1993/4/14

UR - https://www.scopus.com/pages/publications/33749446583

U2 - 10.1088/0022-3727/26/4A/031

DO - 10.1088/0022-3727/26/4A/031

M3 - Article

SN - 0022-3727

VL - 26

SP - A146-A150

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 4

ER -

X-ray diffractometry of small defects in layered systems

Fields of science

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