X-ray diffraction investigation of single step and step-graded SiGe alloy buffers for the growth of short period SimGen superlattices using reciprocal space mapping

  • Günther Bauer
  • , P. Hamberger
  • , E. Kasper
  • , H. Kibbel
  • , Ewald Koppensteiner
  • , A. Pesek
  • , H. Presting

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1783-1785
Number of pages3
JournalApplied Physics Letters
Volume62
Issue number15
DOIs
Publication statusPublished - 1993

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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