@article{f8cd9313cfb745afb22f97d4bf22614b,
title = "Vertical correlation of SiGe islands in SiGe/Si superlattices: x-ray diffraction versus transmission electron microscopy",
author = "G{\"u}nther Bauer and K. Eberl and F. Ernst and I. Kegel and O. Kienzle and Metzger, \{Till Hartmut\} and T. Roch and Schmidt, \{Oliver G.\} and Julian Stangl",
year = "2000",
month = dec,
day = "11",
doi = "10.1063/1.1333683",
language = "English",
volume = "77",
pages = "3953--3955",
journal = "Applied Physics Letters",
publisher = "American Institute of Physics",
number = "24",
}