Variability Modelling Throughout the Product Line Lifecycle

Christa Schwanninger; Iris Groher; Christoph Elsner; Martin Lehofer

doi:10.1007/978-3-642-04425-0_55

Variability Modelling Throughout the Product Line Lifecycle

Christa Schwanninger
, Iris Groher
, Christoph Elsner
, Martin Lehofer

Institute of Business Informatics - Software Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

This paper summarizes our experience with introducing feature modelling into several product lines within Siemens. Feature models are used for solving various tasks in the product line lifecycle, starting with scoping the reusable asset base up to support for actual product configuration. Using feature models as primary artefacts for managing variability early in the lifecycle, we could improve the efficiency and transparency of scoping activities considerably and made the development efforts way easier to schedule. On the other end of the lifecycle, feature models lowered the engineering efforts in solution business in supporting product configuration and instantiation.

Original language	English
Title of host publication	12th International Conference on Model Driven Engineering Languages and Systems (MODELS), Denver, Colorado, USA, October 4-9, 2009
Pages	685-689
Number of pages	5
DOIs	https://doi.org/10.1007/978-3-642-04425-0_55
Publication status	Published - 2009

Publication series

Name	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume	5795 LNCS
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Fields of science

102 Computer Sciences
102009 Computer simulation
102015 Information systems
102026 Virtual reality
102027 Web engineering
202022 Information technology
502050 Business informatics

JKU Focus areas

Computation in Informatics and Mathematics
Management and Innovation

Access to Document

10.1007/978-3-642-04425-0_55

Cite this

Schwanninger, C., Groher, I., Elsner, C., & Lehofer, M. (2009). Variability Modelling Throughout the Product Line Lifecycle. In 12th International Conference on Model Driven Engineering Languages and Systems (MODELS), Denver, Colorado, USA, October 4-9, 2009 (pp. 685-689). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 5795 LNCS). https://doi.org/10.1007/978-3-642-04425-0_55

Schwanninger, Christa ; Groher, Iris ; Elsner, Christoph et al. / Variability Modelling Throughout the Product Line Lifecycle. 12th International Conference on Model Driven Engineering Languages and Systems (MODELS), Denver, Colorado, USA, October 4-9, 2009. 2009. pp. 685-689 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)).

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title = "Variability Modelling Throughout the Product Line Lifecycle",

abstract = "This paper summarizes our experience with introducing feature modelling into several product lines within Siemens. Feature models are used for solving various tasks in the product line lifecycle, starting with scoping the reusable asset base up to support for actual product configuration. Using feature models as primary artefacts for managing variability early in the lifecycle, we could improve the efficiency and transparency of scoping activities considerably and made the development efforts way easier to schedule. On the other end of the lifecycle, feature models lowered the engineering efforts in solution business in supporting product configuration and instantiation.",

author = "Christa Schwanninger and Iris Groher and Christoph Elsner and Martin Lehofer",

year = "2009",

doi = "10.1007/978-3-642-04425-0\_55",

language = "English",

isbn = "3642044247",

series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",

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Schwanninger, C, Groher, I, Elsner, C & Lehofer, M 2009, Variability Modelling Throughout the Product Line Lifecycle. in 12th International Conference on Model Driven Engineering Languages and Systems (MODELS), Denver, Colorado, USA, October 4-9, 2009. Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 5795 LNCS, pp. 685-689. https://doi.org/10.1007/978-3-642-04425-0_55

Variability Modelling Throughout the Product Line Lifecycle. / Schwanninger, Christa; Groher, Iris; Elsner, Christoph et al.
12th International Conference on Model Driven Engineering Languages and Systems (MODELS), Denver, Colorado, USA, October 4-9, 2009. 2009. p. 685-689 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 5795 LNCS).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

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AB - This paper summarizes our experience with introducing feature modelling into several product lines within Siemens. Feature models are used for solving various tasks in the product line lifecycle, starting with scoping the reusable asset base up to support for actual product configuration. Using feature models as primary artefacts for managing variability early in the lifecycle, we could improve the efficiency and transparency of scoping activities considerably and made the development efforts way easier to schedule. On the other end of the lifecycle, feature models lowered the engineering efforts in solution business in supporting product configuration and instantiation.

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Schwanninger C, Groher I, Elsner C, Lehofer M. Variability Modelling Throughout the Product Line Lifecycle. In 12th International Conference on Model Driven Engineering Languages and Systems (MODELS), Denver, Colorado, USA, October 4-9, 2009. 2009. p. 685-689. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)). doi: 10.1007/978-3-642-04425-0_55

Variability Modelling Throughout the Product Line Lifecycle

Abstract

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JKU Focus areas

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