Abstract
Due to ESD events on powered ICs, soft failures can occur in the IO pad frame and in the core of the IC. A detector cell can be used to detect these faults and distinguish between valid signal changes and soft failures. A corresponding digital detector cell with adjusted switching thresholds is presented in this paper. Since the detector cell is correspondingly small (150μm × 16.5μm), it can be placed several times in the IC and read out via a scan chain.
| Original language | English |
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| Title of host publication | 2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI) |
| Number of pages | 4 |
| Publication status | Published - 2018 |
Fields of science
- 102 Computer Sciences
- 202 Electrical Engineering, Electronics, Information Engineering
JKU Focus areas
- Mechatronics and Information Processing
- Nano-, Bio- and Polymer-Systems: From Structure to Function