Transmission electron microscopy of Tl-1223 films on lanthanum aluminate

Kazimierz Przybylski, Oliver Heiml, Gerhard Gritzner

Research output: Contribution to journalArticlepeer-review

Abstract

The microstructure of (Tl, Pb)-1223 films on (100)LaAlO3 single-crystalline substrate was investigated on cross-sections of the specimens by conventional transmission electron microscopy in combination with selected area electron diffraction and by high resolution transmission electron microscopy. The (Tl,Pb)-1223 films showed the presence of the planar defects such as stacking faults and twins on the [100] planes. The numerous planar defects are accompanied by visible dislocations. Sporadically CaO grains were identified as secondary phase in the (Tl, Pb)-1223 film by energy dispersive X-ray diffraction point analysis and by X-ray mapping. The adhesion of the Tl-1223 film to the substrate was excellent.
Original languageEnglish
Pages (from-to)63 - 68
Number of pages6
JournalPhysica C: Superconductivity
Volume423
DOIs
Publication statusPublished - 2005

Fields of science

  • 104005 Electrochemistry
  • 104006 Solid state chemistry
  • 104014 Surface chemistry
  • 104017 Physical chemistry
  • 105113 Crystallography
  • 105116 Mineralogy
  • 503013 Subject didactics of natural sciences
  • 204 Chemical Process Engineering
  • 204001 Inorganic chemical technology
  • 205016 Materials testing
  • 210006 Nanotechnology
  • 211104 Metallurgy

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