Abstract
Software Product Lines (SPLs) are families of related software systems distinguished by the set of features each one provides. The commonly large number of variants that can be derived from an SPL poses a unique set of challenges, because it is not feasible to test all the individual variants. Over the last few years many approaches for SPL testing have been devised. They usually select a set of variants to test based on some covering criterion. A problem when evaluating these testing approaches is properly comparing them to one another. Even though some benchmarks have been proposed, they focus on covering criteria and do not consider fault data in their analysis. Considering the dire lack of publicly available fault data, in this paper we present the first results of our ongoing project to introduce simulated faults into SPLs along with using evolutionary techniques for synthesizing unit test cases for SPL examples.
Original language | English |
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Title of host publication | Proceedings of the 33rd Annual ACM Symposium on Applied Computing, SAC 2018, Pau, France, April 09-13, 2018 |
Editors | Hisham M. Haddad and Roger L. Wainwright and Richard Chbeir |
Publisher | ACM |
Pages | 2034-2041 |
Number of pages | 8 |
DOIs | |
Publication status | Published - 2018 |
Fields of science
- 102 Computer Sciences
- 102022 Software development
JKU Focus areas
- Computation in Informatics and Mathematics
- Engineering and Natural Sciences (in general)