The influence of process parameters and annealing temperature on the physical properties of sputtered NiO thin films

I. Hotovy, J. Huran, S. Hascik, J. Liday, Helmut Sitter, L. Spiess

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)237-242
Number of pages6
JournalVacuum
Volume69
Publication statusPublished - 2003

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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