Synchrotron Radiation-excited Glancing Incidence XRF for Depth Profile and Thin-Film Analysis of Light Elements

P. Kregsamer, C. Streli, P. Wobrauschek, H. Gatterbauer, P. Pianetta, Leopold Palmetshofer, Lora L. Brehm

Research output: Contribution to journal › Article › peer-review

Fields of science

@article{359502dd41194852b640f4bb2c38a59e,

title = "Synchrotron Radiation-excited Glancing Incidence XRF for Depth Profile and Thin-Film Analysis of Light Elements",

author = "P. Kregsamer and C. Streli and P. Wobrauschek and H. Gatterbauer and P. Pianetta and Leopold Palmetshofer and Brehm, \{Lora L.\}",

year = "1999",

doi = "10.1002/(SICI)1097-4539(199907/08)28:4<292::AID-XRS354>3.0.CO;2-A",

language = "English",

volume = "28",

pages = "292--296",

journal = "X-Ray Spectrometry",

number = "4",

}

TY - JOUR

T1 - Synchrotron Radiation-excited Glancing Incidence XRF for Depth Profile and Thin-Film Analysis of Light Elements

AU - Kregsamer, P.

AU - Streli, C.

AU - Wobrauschek, P.

AU - Gatterbauer, H.

AU - Pianetta, P.

AU - Palmetshofer, Leopold

AU - Brehm, Lora L.

PY - 1999

Y1 - 1999

UR - https://www.scopus.com/pages/publications/0033414687

U2 - 10.1002/(SICI)1097-4539(199907/08)28:4<292::AID-XRS354>3.0.CO;2-A

DO - 10.1002/(SICI)1097-4539(199907/08)28:4<292::AID-XRS354>3.0.CO;2-A

M3 - Article

VL - 28

SP - 292

EP - 296

JO - X-Ray Spectrometry

JF - X-Ray Spectrometry

IS - 4

ER -