Structural Properties of Semiconductor Nanostructures from X-Ray Scattering

Vaclav Holy, Oliver G. Schmidt, Julian Stangl, Mathieu Stoffel, Anke Hesse, Günther Bauer, Tobias Schülli

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	227-237
Number of pages	11
Journal	Advances in Solid State Physics
Volume	44
DOIs	https://doi.org/10.1007/978-3-540-39970-4_18
Publication status	Published - 2004

Fields of science

This output contributes to the following UN Sustainable Development Goals (SDGs)

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title = "Structural Properties of Semiconductor Nanostructures from X-Ray Scattering",

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AU - Holy, Vaclav

AU - Schmidt, Oliver G.

AU - Stangl, Julian

AU - Stoffel, Mathieu

AU - Hesse, Anke

AU - Bauer, Günther

AU - Schülli, Tobias

PY - 2004

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EP - 237

JO - Advances in Solid State Physics

JF - Advances in Solid State Physics

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