Structural and electronic implications for carrier injection into organic semiconductors

Mauro Castellani; Ingo Salzmann; Philippe Bugnon; Shuwen Yu; Martin Oehzelt; Norbert Koch

doi:10.1007/s00339-009-5336-6

Structural and electronic implications for carrier injection into organic semiconductors

Mauro Castellani
, Ingo Salzmann
, Philippe Bugnon
, Shuwen Yu
, Martin Oehzelt
, Norbert Koch

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1-9
Number of pages	9
Journal	Applied Physics A
Volume	97
Issue number	1
DOIs	https://doi.org/10.1007/s00339-009-5336-6
Publication status	Published - Oct 2009

Fields of science

103020 Surface physics
103008 Experimental physics
103 Physics, Astronomy
210006 Nanotechnology
104014 Surface chemistry

JKU Focus areas

Nano-, Bio- and Polymer-Systems: From Structure to Function
Engineering and Natural Sciences (in general)

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10.1007/s00339-009-5336-6

Cite this

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title = "Structural and electronic implications for carrier injection into organic semiconductors",

author = "Mauro Castellani and Ingo Salzmann and Philippe Bugnon and Shuwen Yu and Martin Oehzelt and Norbert Koch",

year = "2009",

month = oct,

doi = "10.1007/s00339-009-5336-6",

language = "English",

volume = "97",

pages = "1--9",

journal = "Applied Physics A",

issn = "1432-0630",

publisher = "Springer Verlag",

number = "1",

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T1 - Structural and electronic implications for carrier injection into organic semiconductors

AU - Castellani, Mauro

AU - Salzmann, Ingo

AU - Bugnon, Philippe

AU - Yu, Shuwen

AU - Oehzelt, Martin

AU - Koch, Norbert

PY - 2009/10

Y1 - 2009/10

UR - http://www.springerlink.com/content/515564h934804837/

U2 - 10.1007/s00339-009-5336-6

DO - 10.1007/s00339-009-5336-6

M3 - Article

SN - 1432-0630

VL - 97

SP - 1

EP - 9

JO - Applied Physics A

JF - Applied Physics A

IS - 1

ER -

Structural and electronic implications for carrier injection into organic semiconductors

Fields of science

JKU Focus areas

Access to Document

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Cite this