Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffraction and grazing incidence diffraction

Günther Bauer, A. A. Darhuber, N. Darowski, Vaclav Holy, D. Lübbert, P. Mikulik, U. Pietsch, Friedrich Schäffler, Julian Stangl, Stefan Zerlauth, Y. Zhuang

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalJournal of Physics D: Applied Physics
Publication statusPublished - 1999

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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