Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction

Günther Bauer; A. A. Darhuber; N. Darowski; Vaclav Holy; D. Lübbert; P. Mikulik; U. Pietsch; Friedrich Schäffler; Julian Stangl; Stefan Zerlauth; Y. Zhuang

Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction

Günther Bauer
, A. A. Darhuber
, N. Darowski
, Vaclav Holy
, D. Lübbert
, P. Mikulik
, U. Pietsch
, Friedrich Schäffler
, Julian Stangl
, Stefan Zerlauth
, Y. Zhuang

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Journal of Applied Physics
Publication status	Published - 1999

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
103040 Photonics
202032 Photovoltaics
210006 Nanotechnology

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

@article{6f3a69591af843a4bb472b60d70715ea,

title = "Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction",

author = "G{\"u}nther Bauer and Darhuber, \{A. A.\} and N. Darowski and Vaclav Holy and D. L{\"u}bbert and P. Mikulik and U. Pietsch and Friedrich Sch{\"a}ffler and Julian Stangl and Stefan Zerlauth and Y. Zhuang",

year = "1999",

language = "English",

journal = "Journal of Applied Physics",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction

AU - Bauer, Günther

AU - Darhuber, A. A.

AU - Darowski, N.

AU - Holy, Vaclav

AU - Lübbert, D.

AU - Mikulik, P.

AU - Pietsch, U.

AU - Schäffler, Friedrich

AU - Stangl, Julian

AU - Zerlauth, Stefan

AU - Zhuang, Y.

PY - 1999

Y1 - 1999

M3 - Article

JO - Journal of Applied Physics

JF - Journal of Applied Physics

ER -