Strain determination in multilayers by complementary anomalous x-ray diffraction

Tobias Schülli, Rainer T. Lechner, Julian Stangl, Till Hartmut Metzger, Günther Bauer, Michael Sztucki, Gunther Springholz

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)80-81
Number of pages2
JournalESRF Highlights (European Synchrotron Radiation Facility)
Publication statusPublished - 2004

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

Cite this