Spectral Analysis of Defects in a SiC Trench Power MOSFET by Electrical Excitation

  • Dominik Biermeier

Research output: Thesis › Master's / Diploma thesis

Original languageGerman (Austria)
Supervisors/Reviewers
  • Bonanni, Alberta, Supervisor
  • Bockstedte, Michel, Supervisor
Publication statusPublished - 2022

Fields of science

  • 210006 Nanotechnology
  • 103 Physics, Astronomy
  • 103011 Semiconductor physics
  • 103018 Materials physics
  • 103009 Solid state physics
  • 103017 Magnetism

JKU Focus areas

  • Sustainable Development: Responsible Technologies and Management

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