Simultaneous Detection of Optical Retardation and Axis Orientation by Polarization-Sensitive Full-Field Optical Coherence Microscopy for Material Testing

Bettina Heise, B. Buchroithner, S.E. Schausberger, P. Hierzenberger, David Stifter

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number055602
Pages (from-to)055602
Number of pages1
JournalLaser Physics Letters
Volume11
DOIs
Publication statusPublished - 2014

Fields of science

  • 210006 Nanotechnology
  • 103 Physics, Astronomy
  • 103020 Surface physics
  • 103021 Optics

JKU Focus areas

  • Engineering and Natural Sciences (in general)

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