Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production

Edwin Lughofer; Robert Pollak; Alexandru Ciprian Zavoianu; Pauline Meyer-Heye; Helmut Zorrer; Christian Eitzinger; Julia Haim; Thomas Radauer

doi:10.1109/CYBConf.2017.7985808

Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production

Edwin Lughofer^*
, Robert Pollak
, Alexandru Ciprian Zavoianu
, Pauline Meyer-Heye
, Helmut Zorrer
, Christian Eitzinger
, Julia Haim
, Thomas Radauer

^*Corresponding author for this work

Institute for Mathematical Methods in Medicine and Data Based Modeling

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Original language	English
Title of host publication	Proceedings of the 3rd IEEE International Conference on Cybernetics
Subtitle of host publication	CYBCONF 2017
Place of Publication	Exeter, UK
Publisher	Institute of Electrical and Electronics Engineers Inc.
Number of pages	8
ISBN (Electronic)	9781538622018
DOIs	https://doi.org/10.1109/CYBConf.2017.7985808
Publication status	Published - Jun 2017
Event	3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Exeter, United Kingdom Duration: 21 Jun 2017 → 23 Jun 2017

Publication series

Name	2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings

Conference

Conference	3rd IEEE International Conference on Cybernetics, CYBCONF 2017
Country/Territory	United Kingdom
City	Exeter
Period	21.06.2017 → 23.06.2017

Fields of science

101 Mathematics
101013 Mathematical logic
101024 Probability theory
102001 Artificial intelligence
102003 Image processing
102019 Machine learning
603109 Logic
202027 Mechatronics
101027 Dynamical systems
102023 Supercomputing
101004 Biomathematics
102035 Data science
101014 Numerical mathematics
101028 Mathematical modelling
102009 Computer simulation
206003 Medical physics
206001 Biomedical engineering
101020 Technical mathematics

JKU Focus areas

Computation in Informatics and Mathematics
Mechatronics and Information Processing
Nano-, Bio- and Polymer-Systems: From Structure to Function
Digital Transformation

Access to Document

10.1109/CYBConf.2017.7985808

Cite this

Lughofer, E., Pollak, R., Zavoianu, A. C., Meyer-Heye, P., Zorrer, H., Eitzinger, C., Haim, J., & Radauer, T. (2017). Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production. In Proceedings of the 3rd IEEE International Conference on Cybernetics: CYBCONF 2017 Article 7985808 (2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CYBConf.2017.7985808

Lughofer, Edwin ; Pollak, Robert ; Zavoianu, Alexandru Ciprian et al. / Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production. Proceedings of the 3rd IEEE International Conference on Cybernetics: CYBCONF 2017. Exeter, UK : Institute of Electrical and Electronics Engineers Inc., 2017. (2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings).

@inproceedings{cb1cf3031d294d7ea64afc0d28346917,

title = "Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production",

author = "Edwin Lughofer and Robert Pollak and Zavoianu, \{Alexandru Ciprian\} and Pauline Meyer-Heye and Helmut Zorrer and Christian Eitzinger and Julia Haim and Thomas Radauer",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 ; Conference date: 21-06-2017 Through 23-06-2017",

year = "2017",

month = jun,

doi = "10.1109/CYBConf.2017.7985808",

language = "English",

series = "2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "Proceedings of the 3rd IEEE International Conference on Cybernetics",

}

Lughofer, E, Pollak, R, Zavoianu, AC, Meyer-Heye, P, Zorrer, H, Eitzinger, C, Haim, J & Radauer, T 2017, Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production. in Proceedings of the 3rd IEEE International Conference on Cybernetics: CYBCONF 2017., 7985808, 2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings, Institute of Electrical and Electronics Engineers Inc., Exeter, UK, 3rd IEEE International Conference on Cybernetics, CYBCONF 2017, Exeter, United Kingdom, 21.06.2017. https://doi.org/10.1109/CYBConf.2017.7985808

Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production. / Lughofer, Edwin; Pollak, Robert; Zavoianu, Alexandru Ciprian et al.
Proceedings of the 3rd IEEE International Conference on Cybernetics: CYBCONF 2017. Exeter, UK: Institute of Electrical and Electronics Engineers Inc., 2017. 7985808 (2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production

AU - Lughofer, Edwin

AU - Pollak, Robert

AU - Zavoianu, Alexandru Ciprian

AU - Meyer-Heye, Pauline

AU - Zorrer, Helmut

AU - Eitzinger, Christian

AU - Haim, Julia

AU - Radauer, Thomas

PY - 2017/6

Y1 - 2017/6

UR - https://www.scopus.com/pages/publications/85027884105

U2 - 10.1109/CYBConf.2017.7985808

DO - 10.1109/CYBConf.2017.7985808

M3 - Conference proceedings

T3 - 2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings

BT - Proceedings of the 3rd IEEE International Conference on Cybernetics

PB - Institute of Electrical and Electronics Engineers Inc.

CY - Exeter, UK

T2 - 3rd IEEE International Conference on Cybernetics, CYBCONF 2017

Y2 - 21 June 2017 through 23 June 2017

ER -

Lughofer E, Pollak R, Zavoianu AC, Meyer-Heye P, Zorrer H, Eitzinger C et al. Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production. In Proceedings of the 3rd IEEE International Conference on Cybernetics: CYBCONF 2017. Exeter, UK: Institute of Electrical and Electronics Engineers Inc. 2017. 7985808. (2017 3rd IEEE International Conference on Cybernetics, CYBCONF 2017 - Proceedings). doi: 10.1109/CYBConf.2017.7985808

Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production

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Self-Adaptive Time-Series Based Forecast Models for Predicting Quality Criteria in Microfluidics Chip Production

Publication series

Conference

Fields of science

JKU Focus areas

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