Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements

L. Michalas; A. Lucibello; Giorgio Badino; C. H. Joseph; Enrico Brinciotti; Ferry Kienberger; Emanuela Proietti; Romolo Marcelli

Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements

L. Michalas
, A. Lucibello
, Giorgio Badino
, C. H. Joseph
, Enrico Brinciotti
, Ferry Kienberger
, Emanuela Proietti
, Romolo Marcelli

Department of Applied Experimental Biophysics

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings

Original language	English
Title of host publication	Microwave Conference (EuMC), 2015 European
Number of pages	4
Publication status	Published - 2015

Fields of science

106006 Biophysics

JKU Focus areas

Engineering and Natural Sciences (in general)

Cite this

@inproceedings{486d52a9a9354b5d9aa54ddadcec7e52,

title = "Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements",

author = "L. Michalas and A. Lucibello and Giorgio Badino and Joseph, \{C. H.\} and Enrico Brinciotti and Ferry Kienberger and Emanuela Proietti and Romolo Marcelli",

year = "2015",

language = "English",

booktitle = "Microwave Conference (EuMC), 2015 European",

}

TY - GEN

T1 - Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements

AU - Michalas, L.

AU - Lucibello, A.

AU - Badino, Giorgio

AU - Joseph, C. H.

AU - Brinciotti, Enrico

AU - Kienberger, Ferry

AU - Proietti, Emanuela

AU - Marcelli, Romolo

PY - 2015

Y1 - 2015

M3 - Conference proceedings

BT - Microwave Conference (EuMC), 2015 European

ER -