Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films

A. Wyss, M. Schamel, A.S. Sologubenko, Richard Denk, Michael Hohage, Peter Zeppenfeld, Ralph Spolenak

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	415303
Pages (from-to)	415303
Number of pages	11
Journal	Journal of Physics D: Applied Physics
Volume	48
Issue number	41
DOIs	https://doi.org/10.1088/0022-3727/48/41/415303
Publication status	Published - 2015

Fields of science

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title = "Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films",

author = "A. Wyss and M. Schamel and A.S. Sologubenko and Richard Denk and Michael Hohage and Peter Zeppenfeld and Ralph Spolenak",

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T1 - Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films

AU - Wyss, A.

AU - Schamel, M.

AU - Sologubenko, A.S.

AU - Denk, Richard

AU - Hohage, Michael

AU - Zeppenfeld, Peter

AU - Spolenak, Ralph

PY - 2015

Y1 - 2015

U2 - 10.1088/0022-3727/48/41/415303

DO - 10.1088/0022-3727/48/41/415303

M3 - Article

SN - 0022-3727

VL - 48

SP - 415303

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 41

M1 - 415303

ER -