Reduction of hexavalent chromium embedded in organic insulation and corrosion inhibition layers during X-ray photoelectron spectroscopy (XPS) measurements"

T. Greunz; Roland Steinberger; B. Strauss; David Stifter

doi:10.1016/j.corsci.2018.08.031

Reduction of hexavalent chromium embedded in organic insulation and corrosion inhibition layers during X-ray photoelectron spectroscopy (XPS) measurements"

T. Greunz
, Roland Steinberger
, B. Strauss
, David Stifter

Center for Surface and Nanoanalytics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	39-45
Number of pages	7
Journal	Corrosion Science
Volume	143
DOIs	https://doi.org/10.1016/j.corsci.2018.08.031
Publication status	Published - Oct 2018

Fields of science

210006 Nanotechnology
103 Physics, Astronomy
103020 Surface physics
103021 Optics

JKU Focus areas

Engineering and Natural Sciences (in general)

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10.1016/j.corsci.2018.08.031

Cite this

@article{0ee79e8eef144cbb99ab17921fdace27,

title = "Reduction of hexavalent chromium embedded in organic insulation and corrosion inhibition layers during X-ray photoelectron spectroscopy (XPS) measurements{"}",

author = "T. Greunz and Roland Steinberger and B. Strauss and David Stifter",

year = "2018",

month = oct,

doi = "10.1016/j.corsci.2018.08.031",

language = "English",

volume = "143",

pages = "39--45",

journal = "Corrosion Science",

issn = "1879-0496",

}

TY - JOUR

T1 - Reduction of hexavalent chromium embedded in organic insulation and corrosion inhibition layers during X-ray photoelectron spectroscopy (XPS) measurements"

AU - Greunz, T.

AU - Steinberger, Roland

AU - Strauss, B.

AU - Stifter, David

PY - 2018/10

Y1 - 2018/10

UR - https://www.scopus.com/pages/publications/85051524092

U2 - 10.1016/j.corsci.2018.08.031

DO - 10.1016/j.corsci.2018.08.031

M3 - Article

SN - 1879-0496

VL - 143

SP - 39

EP - 45

JO - Corrosion Science

JF - Corrosion Science

ER -

Reduction of hexavalent chromium embedded in organic insulation and corrosion inhibition layers during X-ray photoelectron spectroscopy (XPS) measurements"

Fields of science

JKU Focus areas

Access to Document

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Cite this