Quantification of the toxic hexavalent chromium content in an organic matrix by X-ray photoelectron spectroscopy (XPS) and ultra-low-angle microtomy (ULAM)

T. Greunz; H. Duchazek; Raffaela Sagl; Jiri Duchoslav; Roland Steinberger; B. Strauss; David Stifter

doi:10.1016/j.apsusc.2016.11.004

Quantification of the toxic hexavalent chromium content in an organic matrix by X-ray photoelectron spectroscopy (XPS) and ultra-low-angle microtomy (ULAM)

T. Greunz, H. Duchazek, Raffaela Sagl, Jiri Duchoslav, Roland Steinberger, B. Strauss, David Stifter

Center for Surface and Nanoanalytics

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	665-671
Number of pages	7
Journal	Applied Surface Science
Volume	396
DOIs	https://doi.org/10.1016/j.apsusc.2016.11.004
Publication status	Published - 2017

Fields of science

210006 Nanotechnology
103 Physics, Astronomy
103020 Surface physics
103021 Optics

JKU Focus areas

Engineering and Natural Sciences (in general)

Access to Document

10.1016/j.apsusc.2016.11.004

Cite this

@article{16b46ab5b82c4e4ca2a7ab1998e7eb86,

title = "Quantification of the toxic hexavalent chromium content in an organic matrix by X-ray photoelectron spectroscopy (XPS) and ultra-low-angle microtomy (ULAM)",

author = "T. Greunz and H. Duchazek and Raffaela Sagl and Jiri Duchoslav and Roland Steinberger and B. Strauss and David Stifter",

year = "2017",

doi = "10.1016/j.apsusc.2016.11.004",

language = "English",

volume = "396",

pages = "665--671",

journal = "Applied Surface Science",

issn = "1873-5584",

publisher = "Elsevier",

}

TY - JOUR

T1 - Quantification of the toxic hexavalent chromium content in an organic matrix by X-ray photoelectron spectroscopy (XPS) and ultra-low-angle microtomy (ULAM)

AU - Greunz, T.

AU - Duchazek, H.

AU - Sagl, Raffaela

AU - Duchoslav, Jiri

AU - Steinberger, Roland

AU - Strauss, B.

AU - Stifter, David

PY - 2017

Y1 - 2017

U2 - 10.1016/j.apsusc.2016.11.004

DO - 10.1016/j.apsusc.2016.11.004

M3 - Article

SN - 1873-5584

VL - 396

SP - 665

EP - 671

JO - Applied Surface Science

JF - Applied Surface Science

ER -