Quality analysis for the production of pelletised materials using Fourier Descriptors

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Abstract

We evaluate the effectiveness of Fourier Descriptors for an in-line characterization of the quality of pelletised materials. For the quality analysis we evaluate the significance of information conveyed by a limited number of low order Fourier Descriptors. Further, we investigate the influence of image resolution and shape on the outcome.
Original languageEnglish
Title of host publication5th International Conference on Optical Characterization of Materials (OCM 2021)
EditorsJürgen Beyerer, Thomas Längle
Place of PublicationKarlsruhe
PublisherKIT Scientific Publishing
Pages153 - 162
Number of pages10
ISBN (Print)978-3-7315-1081-9
DOIs
Publication statusPublished - Mar 2021

Publication series

NameOptical Characterization of Materials
ISSN (Electronic)2510-7240

Fields of science

  • 202012 Electrical measurement technology
  • 202036 Sensor systems
  • 102003 Image processing
  • 202 Electrical Engineering, Electronics, Information Engineering
  • 202027 Mechatronics
  • 202037 Signal processing
  • 103021 Optics

JKU Focus areas

  • Digital Transformation

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