Properties of optically active Si:Er and Si1-xGex layers grown by the sublimation MBE method

Margarita V. Stepikhova, B.A. Andreev, V.B. Shmagin, Z. F. Krasilnik, V.P. Kuznetsov, V. G. Shengurov, S.P. Svetlov, Wolfgang Jantsch, Leopold Palmetshofer, Heinz Ellmer

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)164-169
Number of pages6
JournalThin Solid Films
Volume381
Issue number1
DOIs
Publication statusPublished - Jan 2001

Fields of science

  • 103 Physics, Astronomy
  • 103008 Experimental physics
  • 103020 Surface physics
  • 103005 Atomic physics
  • 103009 Solid state physics
  • 103013 Ion physics
  • 103015 Condensed matter
  • 103017 Magnetism
  • 103018 Materials physics
  • 103021 Optics
  • 103023 Polymer physics
  • 104014 Surface chemistry
  • 104018 Polymer chemistry
  • 503015 Subject didactics of technical sciences
  • 202012 Electrical measurement technology
  • 202036 Sensor systems
  • 203016 Measurement engineering
  • 210001 Nanoanalytics
  • 210004 Nanomaterials
  • 103011 Semiconductor physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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