PCB drop test lifetime assessment based on simulations and cyclic bend tests

P. F. Fuchs, Gerald Pinter, Zoltan Major

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	774–781
Number of pages	7
Journal	Microelectronics Reliability
Volume	53
DOIs	https://doi.org/10.1016/j.microrel.2013.01.001
Publication status	Published - 2015

Fields of science

@article{898b9a44a1774ec09919116405cc4b8f,

title = "PCB drop test lifetime assessment based on simulations and cyclic bend tests",

author = "Fuchs, {P. F.} and Gerald Pinter and Zoltan Major",

year = "2015",

doi = "10.1016/j.microrel.2013.01.001",

language = "English",

volume = "53",

pages = "774–781",

journal = "Microelectronics Reliability",

issn = "1872-941X",

publisher = "Elsevier",

}