Oxygen Gettering and Thermal Donor Formation at Post-implantation Annealing of Hydrogen-implanted Czochralsky Silicon

A. Ulyashin, Yu. A. Bumay, W. R. Fahrner, A. I. Ivanovo, R. Job, Leopold Palmetshofer

Research output: Chapter in Book/Report/Conference proceedingConference proceedings

Original languageEnglish
Title of host publicationSymposium E – Defects and Diffusion in Silicon Processing
Editors T.Diaz de la Rubia, S. Coffa, C.S. Rafferty, P.A. Stolk
Pages95-100
Number of pages6
Volume469
DOIs
Publication statusPublished - 1997

Publication series

NameMaterials Research Society Symposium - Proceedings
ISSN (Print)0272-9172

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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