Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

Roland Steinberger; Carlos Celedon; Barbara Bruckner; Dietmar Roth; Jiri Duchoslav; Martin Arndt; Philipp Kürnsteiner; T. Steck; Josef Faderl; C. K. Riener; Gerhard Angeli; Peter Bauer; David Stifter

doi:10.1016/j.apsusc.2017.03.163

Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

Roland Steinberger
, Carlos Celedon
, Barbara Bruckner
, Dietmar Roth
, Jiri Duchoslav
, Martin Arndt
, Philipp Kürnsteiner
, T. Steck
, Josef Faderl
, C. K. Riener
, Gerhard Angeli
, Peter Bauer
, David Stifter

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	189-196
Number of pages	8
Journal	Applied Surface Science
Volume	411
DOIs	https://doi.org/10.1016/j.apsusc.2017.03.163
Publication status	Published - 2017

Fields of science

103 Physics, Astronomy
103008 Experimental physics

JKU Focus areas

Nano-, Bio- and Polymer-Systems: From Structure to Function
Engineering and Natural Sciences (in general)

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10.1016/j.apsusc.2017.03.163

Cite this

Steinberger, R., Celedon, C., Bruckner, B., Roth, D., Duchoslav, J., Arndt, M., Kürnsteiner, P., Steck, T., Faderl, J., Riener, C. K., Angeli, G., Bauer, P., & Stifter, D. (2017). Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions. Applied Surface Science, 411, 189-196. https://doi.org/10.1016/j.apsusc.2017.03.163

@article{930bdfb3198140d68c69e614c79cdaea,

title = "Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions",

author = "Roland Steinberger and Carlos Celedon and Barbara Bruckner and Dietmar Roth and Jiri Duchoslav and Martin Arndt and Philipp K{\"u}rnsteiner and T. Steck and Josef Faderl and Riener, \{C. K.\} and Gerhard Angeli and Peter Bauer and David Stifter",

year = "2017",

doi = "10.1016/j.apsusc.2017.03.163",

language = "English",

volume = "411",

pages = "189--196",

journal = "Applied Surface Science",

issn = "1873-5584",

publisher = "Elsevier",

}

Steinberger, R, Celedon, C, Bruckner, B, Roth, D, Duchoslav, J, Arndt, M, Kürnsteiner, P, Steck, T, Faderl, J, Riener, CK, Angeli, G, Bauer, P & Stifter, D 2017, 'Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions', Applied Surface Science, vol. 411, pp. 189-196. https://doi.org/10.1016/j.apsusc.2017.03.163

TY - JOUR

T1 - Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

AU - Steinberger, Roland

AU - Celedon, Carlos

AU - Bruckner, Barbara

AU - Roth, Dietmar

AU - Duchoslav, Jiri

AU - Arndt, Martin

AU - Kürnsteiner, Philipp

AU - Steck, T.

AU - Faderl, Josef

AU - Riener, C. K.

AU - Angeli, Gerhard

AU - Bauer, Peter

AU - Stifter, David

PY - 2017

Y1 - 2017

UR - http://www.sciencedirect.com/science/article/pii/S0169433217308450

U2 - 10.1016/j.apsusc.2017.03.163

DO - 10.1016/j.apsusc.2017.03.163

M3 - Article

SN - 1873-5584

VL - 411

SP - 189

EP - 196

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

Fields of science

JKU Focus areas

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Other files and links

Neutralization of Noble Gas Ions at Oxide Surfaces in Low Energy Ion Scattering (NEO-LEIS)

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Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

Fields of science

JKU Focus areas

Access to Document

Other files and links

Projects

Neutralization of Noble Gas Ions at Oxide Surfaces in Low Energy Ion Scattering (NEO-LEIS)

Cite this