Optical Profilometer for Quality Control of Soldering Joints

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Abstract

A low cost 3D non–contacting profile scanning method for both specular and diffuse reflecting surfaces will be presented. The resolution in x– and y–directions is about 650 nm and 1 µm in out of plane direction. The method is based on a commercially available CD pickup head. The CD pickup head will be driven in a way that the error of focus signal is used for an out of plane measurement (optical pro-filometer). Theoretical relations as well as mea-surement results will be shown in this proposed paper.
Original languageEnglish
Title of host publicationProceedings of the XX IMEKO World Congress
Number of pages5
Publication statusPublished - Sept 2012

Fields of science

  • 102003 Image processing
  • 202024 Laser technology
  • 202037 Signal processing
  • 203016 Measurement engineering

JKU Focus areas

  • Mechatronics and Information Processing

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