Optical characterization of thin films with randomly rough boundaries using the photovoltage method

R. Pavelka, I. Ohlidal, Jan Hlavka, D. Franta, Helmut Sitter

Research output: Contribution to journal › Article › peer-review

Fields of science

@article{34ef4e93578f4836b703d2b81faa1339,

title = "Optical characterization of thin films with randomly rough boundaries using the photovoltage method",

author = "R. Pavelka and I. Ohlidal and Jan Hlavka and D. Franta and Helmut Sitter",

year = "2000",

month = may,

doi = "10.1016/S0040-6090(00)00734-3",

language = "English",

volume = "366",

pages = "43--50",

journal = "Thin Solid Films",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Optical characterization of thin films with randomly rough boundaries using the photovoltage method

AU - Pavelka, R.

AU - Ohlidal, I.

AU - Hlavka, Jan

AU - Franta, D.

AU - Sitter, Helmut

PY - 2000/5

Y1 - 2000/5

U2 - 10.1016/S0040-6090(00)00734-3

DO - 10.1016/S0040-6090(00)00734-3

M3 - Article

VL - 366

SP - 43

EP - 50

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -