Optical and structural properties of Si/SiGe wires grown on patterned Si substrates

Günther Bauer; A. Daniel; J. Grenzer; Friedrich Schäffler; Christoph Schelling; S. Senz; Y. Zhuang

doi:10.1016/s0040-6090(00)01467-x

Optical and structural properties of Si/SiGe wires grown on patterned Si substrates

Günther Bauer
, A. Daniel
, J. Grenzer
, Friedrich Schäffler
, Christoph Schelling
, S. Senz
, Y. Zhuang

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	51-53
Number of pages	3
Journal	Thin Solid Films
Volume	380
Issue number	1-2
DOIs	https://doi.org/10.1016/s0040-6090(00)01467-x
Publication status	Published - 22 Dec 2000

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
103040 Photonics
202032 Photovoltaics
210006 Nanotechnology

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10.1016/s0040-6090(00)01467-x

Cite this

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title = "Optical and structural properties of Si/SiGe wires grown on patterned Si substrates",

author = "G{\"u}nther Bauer and A. Daniel and J. Grenzer and Friedrich Sch{\"a}ffler and Christoph Schelling and S. Senz and Y. Zhuang",

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doi = "10.1016/s0040-6090(00)01467-x",

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T1 - Optical and structural properties of Si/SiGe wires grown on patterned Si substrates

AU - Bauer, Günther

AU - Daniel, A.

AU - Grenzer, J.

AU - Schäffler, Friedrich

AU - Schelling, Christoph

AU - Senz, S.

AU - Zhuang, Y.

PY - 2000/12/22

Y1 - 2000/12/22

UR - https://www.scopus.com/pages/publications/0034496952

U2 - 10.1016/s0040-6090(00)01467-x

DO - 10.1016/s0040-6090(00)01467-x

M3 - Article

VL - 380

SP - 51

EP - 53

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Optical and structural properties of Si/SiGe wires grown on patterned Si substrates

Fields of science

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