On Power ESD Test of Integrated Circuits

Timm Ostermann

On Power ESD Test of Integrated Circuits

Timm Ostermann

Department of Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

In addition to the ESD characterization of unpowered integrated circuits, especially in the case of hard failures, an ESD characterization of powered ICs is necessary in order to analyze possible soft failures. Especially since these soft failures occur although ESD protection elements are used in the IOs/padframe. To analyze the different coupling paths in the ICs, in addition to a corresponding modeling for the simulation, a check of the adaptation of the simulation to a suitable ESD measurement is required. The present paper deals with the possibilities of analyzing ESD events within a powered IC with suitable modeling and measurement methods.

Original language	English
Title of host publication	Proceedings 17 th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS , Poland
Number of pages	5
Publication status	Published - 2017

Fields of science

102 Computer Sciences
202 Electrical Engineering, Electronics, Information Engineering

JKU Focus areas

Mechatronics and Information Processing
Nano-, Bio- and Polymer-Systems: From Structure to Function

Cite this

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title = "On Power ESD Test of Integrated Circuits",

abstract = "In addition to the ESD characterization of unpowered integrated circuits, especially in the case of hard failures, an ESD characterization of powered ICs is necessary in order to analyze possible soft failures. Especially since these soft failures occur although ESD protection elements are used in the IOs/padframe. To analyze the different coupling paths in the ICs, in addition to a corresponding modeling for the simulation, a check of the adaptation of the simulation to a suitable ESD measurement is required. The present paper deals with the possibilities of analyzing ESD events within a powered IC with suitable modeling and measurement methods.",

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AB - In addition to the ESD characterization of unpowered integrated circuits, especially in the case of hard failures, an ESD characterization of powered ICs is necessary in order to analyze possible soft failures. Especially since these soft failures occur although ESD protection elements are used in the IOs/padframe. To analyze the different coupling paths in the ICs, in addition to a corresponding modeling for the simulation, a check of the adaptation of the simulation to a suitable ESD measurement is required. The present paper deals with the possibilities of analyzing ESD events within a powered IC with suitable modeling and measurement methods.

M3 - Conference proceedings

BT - Proceedings 17 th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS , Poland

ER -