Noise Variance and Signal-to-Noise Ratio Estimation from Spectral Data

Stefan Schuster, Dominik Exel, Stefan Scheiblhofer, Dominik Zankl, Vera Ganglberger, Johann Reisinger, Bernhard Zagar

Research output: Chapter in Book/Report/Conference proceedingConference proceedingspeer-review

Abstract

In most real-world signal processing and measurement applications, unavoidable measurement noise is one of the key factors that limits overall system performance. To be able to assess the performance of a signal processing system in-situ, noise variance and signal-to-noise ratio, respectively can only be estimated from available measurement data. Furthermore, the statistical performance of these estimates is of importance. While noise variance estimation can be done in theory by simply applying some well-known estimators, this standard approach can fail in many practical applications due to unavoidable modeling inaccuracies. To overcome this, we extend an approach for noise variance estimation from spectral data using data windows. The only necessary prerequisite for the applicability of the algorithm is the existence of a spectral region containing noise only. By applying robust estimation techniques, even this assumption can be relaxed to some extent. We also analyze the corresponding Cramér-Rao bounds and validate the approach by means of Monte-Carlo simulations. The case of signal-to-noise ratio estimation in sinusoidal models is treated as a special case of particular interest, together with a discussion of the colored noise case and practical application examples. Furthermore, the Cramér-Rao bounds and simulation results are compared with real world measurement results from a radioacoustic-sounding-system application.
Original languageEnglish
Title of host publication2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2019) Proceedings
Pages1416 - 1421
Number of pages6
Publication statusPublished - May 2019

Fields of science

  • 202012 Electrical measurement technology
  • 202036 Sensor systems
  • 202027 Mechatronics
  • 202037 Signal processing

JKU Focus areas

  • Digital Transformation

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