New Technique of Measurement of Optical Parameters of Thin Films

Jan Hlavka, I. Ohlidal, Frantisek Vizda, Helmut Sitter

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)209-212
Number of pages4
JournalThin Solid Films
Volume279
Issue number1-2
DOIs
Publication statusPublished - Jun 1996

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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