Multiscale Approach for the Analysis of Channeling Profile Measurements of Ion Implantation Damage

G. Hobler, G. Otto, D. Kovac, Leopold Palmetshofer, Karl Emanuel Mayerhofer, Kurt Piplits

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)360-363
Number of pages4
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and
Volume228
Publication statusPublished - 2005

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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