Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization

  • Nikolaus Doppelhammer*
  • , Daniel Spira
  • , Anjul Rais
  • , Dries Vandenabeele
  • , Wauter Wangermez
  • , Charles McMonagle
  • , Dmitry Chernyshov
  • , Eric Breynaert
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

A multi-modal platform enabling simultaneous impedance spectroscopy and X-ray scattering is presented. When applied to zeolite crystallization, four-electrode impedance measurements reliably track bulk crystallization kinetics in agreement with X-ray diffraction, while two-electrode impedance data reveal artefacts from electrode passivation.
Original languageEnglish
Pages (from-to)14919-14922
Number of pages4
JournalChemical Communications
Issue number77
DOIs
Publication statusPublished - 19 Aug 2025

Fields of science

  • 202028 Microelectronics
  • 202027 Mechatronics
  • 202 Electrical Engineering, Electronics, Information Engineering
  • 202037 Signal processing
  • 202036 Sensor systems
  • 104003 Inorganic chemistry
  • 104005 Electrochemistry
  • 104011 Materials chemistry
  • 104024 X-ray structural analysis

JKU Focus areas

  • Digital Transformation

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