Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies

  • T. Roch
  • , Mojmir Meduna
  • , Julian Stangl
  • , Anke Hesse
  • , Rainer T. Lechner
  • , Günther Bauer
  • , G. Dehlinger
  • , L. Diehl
  • , U. Gennser
  • , E. Müller
  • , Detlev Grützmacher

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)8974–8978
Number of pages5
JournalJournal of Applied Physics
Volume91
Issue number11
DOIs
Publication statusPublished - Jun 2002

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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