In situ spectroscopic ellipsometry of MOCVD-grown GaN compounds for on-line composition determination and growth control

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)211-215
Number of pages5
JournalJournal of Crystal Growth
Volume248
Issue numberSUPPL.
DOIs
Publication statusPublished - Feb 2003

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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