In situ reflectance difference spectroscopy of p-type ZnTe:N grown by MBE

David Stifter; Alberta Bonanni; M. Garcia-Rocha; M. Schmid; Kurt Hingerl; Helmut Sitter

doi:10.1016/S0040-6090(00)01089-0

In situ reflectance difference spectroscopy of p-type ZnTe:N grown by MBE

David Stifter, Alberta Bonanni, M. Garcia-Rocha, M. Schmid, Kurt Hingerl, Helmut Sitter

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	41-45
Number of pages	5
Journal	Thin Solid Films
Volume	373
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(00)01089-0
Publication status	Published - 03 Sept 2000

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
210006 Nanotechnology
103040 Photonics
202032 Photovoltaics

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10.1016/S0040-6090(00)01089-0

Cite this

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title = "In situ reflectance difference spectroscopy of p-type ZnTe:N grown by MBE",

author = "David Stifter and Alberta Bonanni and M. Garcia-Rocha and M. Schmid and Kurt Hingerl and Helmut Sitter",

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doi = "10.1016/S0040-6090(00)01089-0",

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T1 - In situ reflectance difference spectroscopy of p-type ZnTe:N grown by MBE

AU - Stifter, David

AU - Bonanni, Alberta

AU - Garcia-Rocha, M.

AU - Schmid, M.

AU - Hingerl, Kurt

AU - Sitter, Helmut

PY - 2000/9/3

Y1 - 2000/9/3

UR - https://www.scopus.com/pages/publications/0034262485

U2 - 10.1016/S0040-6090(00)01089-0

DO - 10.1016/S0040-6090(00)01089-0

M3 - Article

VL - 373

SP - 41

EP - 45

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

In situ reflectance difference spectroscopy of p-type ZnTe:N grown by MBE

Fields of science

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