In-situ growth observation of GaN/AlGaN superlattice structures by simultaneous x-ray diffraction and ellipsometry

Clemens Peter Simbrunner, Tian Li, Alberta Bonanni, A. Kharchenko, J. Bethke, K. Lischka, Helmut Sitter

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)258-262
Number of pages5
JournalJournal of Crystal Growth
Volume308
Issue number2
DOIs
Publication statusPublished - 15 Oct 2007

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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