In-situ growth monitoring by spectroscopy ellipsometry of MOCVD cubic-GaN(001)

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)684-687
Number of pages4
JournalThin Solid Films
Volume455-456
DOIs
Publication statusPublished - 01 May 2004

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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