In-situ and real time characterization of MOCVD growth by high resolution x-ray diffraction

K. Lischka, A. Kharchenko, Helmut Sitter, J. Bethke, J. Wojtok, Klaus Schmidegg

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Number of pages6
JournalReview of Scientific Instruments
Volume76
Publication statusPublished - 2005

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 210006 Nanotechnology
  • 103040 Photonics
  • 202032 Photovoltaics

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