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Imaging of misfit dislocation formation in strained layer heteroepitaxy by Ultrahigh Vacuum Scanning Tunneling Microscopy

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)2236-2239
Number of pages4
JournalPhysical Review Letters
Volume73
Issue number16
DOIs
Publication statusPublished - 1994

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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