Identification and Evaluation of Pitfalls in the Migration from IEC 61131-3 to IEC 61499: A Review

Virendra Ashiwal; Oscar Miguel-Escrig; Bianca Wiesmayr; Alois Zoitl; Julio-Ariel Romero-Pérez

doi:10.1109/OJIES.2025.3558685

Identification and Evaluation of Pitfalls in the Migration from IEC 61131-3 to IEC 61499: A Review

Virendra Ashiwal^*
, Oscar Miguel-Escrig
, Bianca Wiesmayr
, Alois Zoitl
, Julio-Ariel Romero-Pérez

^*Corresponding author for this work

LIT Cyber-Physical Systems Lab

Research output: Contribution to journal › Review article › peer-review

Original language	English
Pages (from-to)	575-590
Number of pages	16
Journal	IEEE Open Journal of the Industrial Electronics Society
Volume	6
DOIs	https://doi.org/10.1109/OJIES.2025.3558685
Publication status	Published - 07 Apr 2025

Fields of science

102 Computer Sciences
202003 Automation
102022 Software development
202017 Embedded systems
202041 Computer engineering
102029 Practical computer science
102025 Distributed systems

JKU Focus areas

Digital Transformation

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/OJIES.2025.3558685Licence: CC BY

https://ieeexplore.ieee.org/document/10955217/

Cite this

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title = "Identification and Evaluation of Pitfalls in the Migration from IEC 61131-3 to IEC 61499: A Review",

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AU - Zoitl, Alois

AU - Romero-Pérez, Julio-Ariel

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