High resolution x-ray diffraction

Günther Bauer, A. Krost, J. Woitok

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Original language	English
Title of host publication	Optical Characterization of Epitaxial Semiconductor Layers
Pages	287–391
DOIs	https://doi.org/10.1007/978-3-642-79678-4_6
Publication status	Published - 1996

Fields of science

This output contributes to the following UN Sustainable Development Goals (SDGs)

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title = "High resolution x-ray diffraction",

author = "G{\"u}nther Bauer and A. Krost and J. Woitok",

year = "1996",

doi = "10.1007/978-3-642-79678-4\_6",

language = "English",

isbn = "3-540-59129",

pages = "287–391",

booktitle = "Optical Characterization of Epitaxial Semiconductor Layers",

}