High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate

B. J. Kim; Y. Matsui; S. Horiuchi; D. Y. Jeong; Christian Deinhofer; Gerhard Gritzner

doi:10.1063/1.1814804

High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate

B. J. Kim
, Y. Matsui
, S. Horiuchi
, D. Y. Jeong
, Christian Deinhofer
, Gerhard Gritzner

Institute of Chemical Technology of Inorganic Materials

Research output: Contribution to journal › Article › peer-review

Abstract

The interface between a screen-printed (Tl0.5Pb0.5)(Sr0.85Ba0.15)2Ca2Cu3Oy (Tl-1223)superconducting film and an untextured Ag substrate is analyzed by transmission electron microscopy (TEM). Preferential orientation between the Tl-1223 grains and the Ag substrate is found. The (001) plane of Tl-1223 grains is parallel to and the {113} plane of Ag is almost parallel to the interface. High-resolution TEM images show that CuO2 planes contact the faceted {113} planes of Ag substrate at the interface. A mechanism for the preferential growth of the Tl-1223 (001)film on untextured Ag substrate is proposed.

Original language	English
Pages (from-to)	4627-4629
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	20
DOIs	https://doi.org/10.1063/1.1814804
Publication status	Published - 15 Nov 2004

Fields of science

104005 Electrochemistry
104006 Solid state chemistry
104014 Surface chemistry
104017 Physical chemistry
105113 Crystallography
105116 Mineralogy
503013 Subject didactics of natural sciences
204 Chemical Process Engineering
204001 Inorganic chemical technology
205016 Materials testing
210006 Nanotechnology
211104 Metallurgy

Access to Document

10.1063/1.1814804

Cite this

@article{f7aaec7bb8b449a09452f80107c1370b,

title = "High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate",

abstract = "The interface between a screen-printed (Tl0.5Pb0.5)(Sr0.85Ba0.15)2Ca2Cu3Oy (Tl-1223)superconducting film and an untextured Ag substrate is analyzed by transmission electron microscopy (TEM). Preferential orientation between the Tl-1223 grains and the Ag substrate is found. The (001) plane of Tl-1223 grains is parallel to and the \{113\} plane of Ag is almost parallel to the interface. High-resolution TEM images show that CuO2 planes contact the faceted \{113\} planes of Ag substrate at the interface. A mechanism for the preferential growth of the Tl-1223 (001)film on untextured Ag substrate is proposed.",

author = "Kim, \{B. J.\} and Y. Matsui and S. Horiuchi and Jeong, \{D. Y.\} and Christian Deinhofer and Gerhard Gritzner",

year = "2004",

month = nov,

day = "15",

doi = "10.1063/1.1814804",

language = "English",

volume = "85",

pages = "4627--4629",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "20",

}

TY - JOUR

T1 - High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate

AU - Kim, B. J.

AU - Matsui, Y.

AU - Horiuchi, S.

AU - Jeong, D. Y.

AU - Deinhofer, Christian

AU - Gritzner, Gerhard

PY - 2004/11/15

Y1 - 2004/11/15

N2 - The interface between a screen-printed (Tl0.5Pb0.5)(Sr0.85Ba0.15)2Ca2Cu3Oy (Tl-1223)superconducting film and an untextured Ag substrate is analyzed by transmission electron microscopy (TEM). Preferential orientation between the Tl-1223 grains and the Ag substrate is found. The (001) plane of Tl-1223 grains is parallel to and the {113} plane of Ag is almost parallel to the interface. High-resolution TEM images show that CuO2 planes contact the faceted {113} planes of Ag substrate at the interface. A mechanism for the preferential growth of the Tl-1223 (001)film on untextured Ag substrate is proposed.

AB - The interface between a screen-printed (Tl0.5Pb0.5)(Sr0.85Ba0.15)2Ca2Cu3Oy (Tl-1223)superconducting film and an untextured Ag substrate is analyzed by transmission electron microscopy (TEM). Preferential orientation between the Tl-1223 grains and the Ag substrate is found. The (001) plane of Tl-1223 grains is parallel to and the {113} plane of Ag is almost parallel to the interface. High-resolution TEM images show that CuO2 planes contact the faceted {113} planes of Ag substrate at the interface. A mechanism for the preferential growth of the Tl-1223 (001)film on untextured Ag substrate is proposed.

UR - https://www.scopus.com/pages/publications/10944222208

U2 - 10.1063/1.1814804

DO - 10.1063/1.1814804

M3 - Article

SN - 0003-6951

VL - 85

SP - 4627

EP - 4629

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

ER -

High-resolution transmission electron microscopy analysis of the interface between a Tl-1223 (001) superconducting film and an untextured Ag substrate

Abstract

Fields of science

Access to Document

Other files and links

Cite this