Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation

A. Daniel, N. Darowski, A. Forchel, J. Grenzer, U. Pietsch, J.P. Reithmaier, S. Rennon

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)4277-4279
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number26
DOIs
Publication statusPublished - 25 Dec 2000

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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